
Die Sorter
芯片挑选至托盘/华夫盒 HJC-560T
自动晶圆到华夫盒挑选设备,带MAPPING功能。Wafer自动装载和卸载可选;可选2×2或4×4华夫盒包装,可选弹夹自动装载/卸载。
设备特点:
-
直驱式固晶邦头,180°摆臂旋转,可自由定制6英寸、8英寸和12英寸晶圆,以及子环和铁环相关处理设备;
- 根据晶圆尺寸(L、W、H),定制多顶针或单顶针机构;
- 晶圆工作台可以配备离子风扇;
- 晶圆台自动搜索机构,自动形成搜索轨迹;
- 根据映射文件自动搜索模具。
- 大吸力专用真空吸嘴;
- 大吸力多吸盘真空夹具;
- 使用真空泄漏检测;
- 华夫盒放置检查功能;
- 识别有缺陷的芯片,如缺角和墨点;
- 简单的可视化操作界面简化了操作;

芯片挑选:Wafer到华夫盒/托盘
方案定制
输出到华夫盒或者 JEDEC盘
可为倒装芯片定制
上下料可以定制为自动上下料
带Mapping 功能
Re:芯片挑选至托盘/华夫盒 HJC-560T
1. System functions | 4. Die suction swing arm | ||
Speed | UPH:10K+/H (related to wafer size and blue film viscosity, subject to actual test results). | Swing arm | 180 rotatable |
XY position accuracy | ±25um | Suction pressure | Adjustable 30g—300g |
Chip rotation | ±3° | 5. Wafer platform | |
2. Chip XY workbench | Range of travel stroke | Customized | |
Chip size | 0.2mm×0.2mm-5mm×5mm (more size can be compatible by changing the lens barrel). | XY resolution | 0.02mil |
Maximum chip ring size | 6 “(other sizes can be customized). | 6. Required facilities | |
Maximum chip area size | 4″ | Voltage/frequency | 220V AC±5%/50HZ |
Resolution ratio | 0.04mil | Compressed air | 0.5MPa(MIN) |
Z height stroke of thimble | 4mm / Resolution: 0.04mil | Rated power | 800W |
3. Image recognition system | Gas consumption | 5L/min | |
Gray scale | 256 gray scale | 7. Size and weight | |
resolution ratio | 752×480 pixels (maximum 130W pixels) | Long x wide x high | 130×120×170cm |
Accuracy of image recognition | ±0.025mil@50mil observation range | Weight | 630kg |
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